HOME
ABOUT US
VISION
TECHNOLOGY
PRODUCTS
OASIS
CONTACT

DOWNLOAD REQUEST FORM
SAMPLE PLANAR DESIGN TEST CASES
*Required
We will be allowing the download of the sample 20 and 14 nm Planar test cases via our FTP server. Please review the Evaluation License Agreement below. By clicking on the "Submit" button below you will have let us know that you have accepted to the terms of the Agreement and will honor its terms.

Thank you for your interest in our technology.
First Name:*
Last Name:*
Company:*
E-mail:*
Yotta Data Sciences ('Yotta') Evaluation License Agreement ('Agreement')

(1) The downloaded Stress Test Cases - that are to be part of this evaluation - are Yotta's Intellectual Property.
     (a) The term of the Agreement will be for 30 days unless directly expressed otherwise by Yotta.
     (b) Thereafter, the test cases and copies of the test cases are to be permanently deleted/wiped; including any modified versions of this licensed intellectual property and/or any other intellectual property that has included/embedded this licensed intellectual property.
     (c) No copies are to be made/shared/sold and distributed to any third-party without, an expressed, consent from Yotta.
(2) Yotta reserves the right to not follow through with this request, for any reason, without explanation.
(3) This is the entire Agreement.

If the party wishing to download Yotta's Stress Test cases can accept these terms and honor them, then, click on the 'Submit' button above.

NEW at Yotta Data Sciences
* US Patents 9,122,825, 8,555,219, 8,266,571 and 7,685,545.
International Patents: China 200980129771.8, Japan  4768896, Korea 10-1580258, Israel 209907, European Patent 2310967.
OASIS® is a Registered Trademark of Thomas Grebinski
© 2008-2022 Yotta Data Sciences, Inc. All rights reserved.
March 20, 2022- Yotta is offering, to qualified partners, a six-month evaluation-period, with support, for its SEMI P39-0416 OASIS Reader/Writer Source Code.

Visit Page: OAS Reader/Writer
Visit Page: OAS Source Code
Please include Yotta's Sample finFET Design Stress Test Cases.